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Chroma ATE sheds light on cutting-edge AI and IoT chip test solutions to meet the surging demand in edge computing


In the realm of high-performance computing driven by the increasing popularity of generative AI, the need for robust edge computing system components and their applications has risen, necessitating stringent chip testing. Chroma ATE, a prominent leader in the power test & measurement industry, has solidified its position in semiconductor component testing. To cater to the growing testing requirements globally, Chroma recently hosted the Chroma ATE Semiconductor Test Seminar in Hsinchu, Taiwan, a key tech hub in Asia. The seminar focused on showcasing Chroma’s advanced solutions for GaN and RF component testing, promising outstanding test performance for customers.

Addressing AI, IoT, GaN/SiC Power Component in Chip Testing Demands

Throughout the second event about Chroma’s next-generation solutions for GaN and RF component testing, George Chang, President of Chroma’s Semiconductor Test Equipment BU, emphasized the significance of the seminar, marking the company’s two-decade-long journey in the global semiconductor test equipment field. By December 2023, Chroma had deployed over four thousand semiconductor test systems globally, securing its position in the top four of the global semiconductor Automated Test Equipment (ATE) market.

chip test

Eugene Lin, Vice President of Chroma’s Semiconductor Test Equipment BU, delved into the recent growth in AI, IoT, and third-generation semiconductors (GaN/SiC). With the escalating demand for semiconductor components, especially in AI and IoT applications, he highlighted the symbiotic relationship between these markets. Chroma’s cutting-edge System-on-Chip (SoC) testing solution, the 3680, demonstrates excellent compatibility with Edge AI and IoT communication chip testing. It efficiently caters to the demanding high-speed and high-precision mixed-signal criteria essential for AI chip testing. “Tailored” specifically for GaN/SiC component testing, the Chroma 3650-S2 addresses the elevated power requirements of these applications. The system, when coupled with the wireless/RF function board HDRF2, can conduct tests on RF chips for satellite-based (GPS, Galileo, etc.) navigation and common wireless network technologies (Bluetooth, Wifi, etc.).

Power Performance – Importance of Precise Measurement of Leakage Current

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Spancer Lee, Senior Manager of Product Marketing at Chroma’s Semiconductor Test Equipment BU, discussed the challenges in testing GaN components. As power levels rise, the leakage current in GaN components significantly impacts overall system power performance. Achieving precise measurements at the nanoampere scale is becoming crucial, especially with rapid switching speeds. The Chroma 3650-S2 addresses the need for accurate measurement of small currents and can handle high-frequency characteristics, providing engineers with a comprehensive view of component performance.

Meeting IoT and 5G Requirements, Introducing New HDRF2 RF Test Module

chip test

Lenskin Tsai, Director of Business Development at ADIVIC Technology, a Chroma Group subsidiary specializing in wireless communication measurement, shared insights into wireless and RF signal measurement. Mr. Tsai explained that the Chroma 3680 chip test platform, when paired with the HDRF2 module, assists customers in meeting their wireless and RF testing requirements even with limited resources. In recent years, high cost of chip test has significantly impacted the 5G sector, leading to fewer investments by industry players. However, based on Chroma’s observations, this challenge has been acknowledged on a global level by the 3rd Generation Partnership Project (3GPP), the global mobile communications standards organization. As part of future spectrum planning, the organization plans to open up the 7-24GHz frequency band in a bid to reduce chip testing costs. In order to continue meeting the demands of both local and foreign service providers for wireless signal testing, Chroma ATE has started work on the creation of its next generation of RF test modules.

Beyond Hardware – Chroma ATE Provides Platform Conversion Tools

Shih-Fang Zeng, Technical Support Manager at Chroma’s Semiconductor Test Equipment BU, addressed the need for platform conversion. He explained how customers can transition from competitors’ semiconductor test platforms to the 3680 efficiently, reducing conversion time from months to about a month. Chroma’s comprehensive conversion solution displays relevant information directly on the system, aiding customers in making adjustments and enhancing efficiency while reducing conversion costs.

Chroma ATE’s Commitment to Market Trends and Customer Demands

Chroma ATE, as a key player in the global ATE market, remains proactive in responding to market trends and customer demands. By targeting applications with high-growth potential in the semiconductor market, Chroma is well-positioned to expand its market footprint. The company’s efficient platform conversion support stands as a crucial asset, allowing it to sustain stable performance and maintain leadership in AI, IoT, and third-generation semiconductor testing.

chip test

Chroma ATE’s Semiconductor Test Equipment BU General Manager, George Chang, stated that as of December 2023, Chroma had shipped over 4,000 semiconductor test equipment units globally, securing its position among the top four players in the global ATE market rankings.

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